A62.4501 Product Details

A62.4503 Research Level Atomic Force Microscope

 

◆ Precision probe positioning device, laser spot alignment adjustment is very easy

◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan

A62.4503 Research Level Atomic Force Microscope

 

◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample

◆ High-precision and wide-ranging piezoelectric ceramic scanners can be freely selected

A62.4503 Research Level Atomic Force Microscope

 

◆ High-magnification objective lens automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area

◆ Spring suspension shockproof method, simple and practical, good shockproof effect

A62.4503 Research Level Atomic Force Microscope

 

◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment

◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

 


 

A62.4503 Catalogue Download

A62.4503 Research Level Atomic Force Microscope

 

 

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