A62.4501 Product Details

Basic Level Atomic Force Microscope

◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong

◆ Precision probe positioning device, laser spot alignment adjustment is very easy

◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan

◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample

Basic Level Atomic Force Microscope

◆ High-precision and wide-ranging piezoelectric ceramic scanners can be freely selected

◆ High-magnification objective lens automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area

◆ Spring suspension shockproof method, simple and practical, good shockproof effect

◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment

◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%

Basic Level Atomic Force Microscope

Basic Level Atomic Force Microscope

 


 

A62.4501 Catalogue Download

Basic Level Atomic Force Microscope

 

 

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