A62.4500 Atomic Force Microscope
- Teaching Level Separate controller & main body design, with Tapping Mode, 4x Objective, Miniaturized Detachable Design
- The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
- The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
- Automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area
- Spring suspension shockproof method, simple and practical, good shockproof effect


